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Japanese Scientists Innovate EUV Scanners for Cost-Effective Chip Development
24/08/07
In a significant breakthrough for the semiconductor industry, Japanese scientists have developed a less complex Extreme Ultraviolet (EUV) scanner, which has the potential to significantly reduce the costs associated with chip development. This innovation is expected to make the process of creating advanced microchips more accessible and affordable, paving the way for a new era in chip manufacturing.
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